Graduate Program in Metrology
Both Academic Master Degree and PhD in Metrology aim is to train professionals in order to develop research activities concerning measurements and calibrations to support the new recommendations from International Bureau of Weights and Measures (BIPM), as well as the new metrological challenges in Physics, Chemistry and Biology, in such a way those can be integrated to information technology, communication, mathematics and engineering solutions.
Main areas and fields of research
Main area
Measurement science and its applications - metrology has a framework of technical and practical knowledge useful for diversified applications in scientific areas committed to pursuing excellence in measurement capability in the various areas of science and engineering.
Fields of research
Advanced measurement methods - aside from scientific and industrial approaches, metrology is also focused on the development of new reference materials and new measurement methods in various areas of technological application. For example, we point out the support for the development of measurement methods and reference materials for forensic sciences, contributing to provide reliable measurements in forensic metrology. New ultrasound measurement methods are also developed with greater focus on the quantitative aspects of measurement, integrating photoacoustic methods for biomedical applications.
This field of research also focuses on the development of computational methods for greater integration between physical, chemical and biological sciences, by using computational genomics algorithms.
Our objectives are:
- To develop and improve measurement methods;
- To foster new technologies in metrology;
- To accomplish both pure and applied researches in metrology.
In order to achieve these objectives, this field of research is supported by the following projects:
- Forensic metrology
- Quantitative ultrasound and photoacoustic
- Computational genomics
- Measurement and image processing
Support for industrial technology development - metrology is an important area of knowledge to support the development of industrial technology, so that it generates innovation in new processes. Within scientific metrology, support is given to the use of metrological references according to the standardization of SI units. Under industrial metrology, the development of measurement and calibration capabilities is encouraged to promote the dissemination of SI units. Metrology is also present in the development of nanotechnology and biotechnology, focusing on measurement methods and references for nanobiometrology. Additionally, the current demands for innovation in industrial processes demand the integration of Information and Communication Technology (ICT) solutions to metrological processes for controlling and monitoring, in a way that the implementation and development of Industry 4.0 can be supported. In addition to these demands, the use of ICT solutions can help increase the reliability of systems, devices and equipment used to measure and verify legal metrology actions.
Our objectives are:
- To develop projects which are related to primary standard;
- To disseminate measurement standards for the industry;
- To keep up with metrology state of the art.
In order to achieve these objectives, this field of research is supported by the following projects:
- Standardization and dissemination of SI units
- Nanobiometrology
- Support for Industry 4.0 development
- ICT adoption to promote reliability in measurement systems
Coordinator and Program Faculty
Coordinator
Program Faculty
Luiz Fernando Rust da Costa Carmo
Rodrigo Pereira Barretto da Costa Felix
Werickson Fortunato de Carvalho Rocha
Former students
Former student | Degree | Lattes link | |
1 | AGDA BEATRIZ GONCALVES COSTA | http://lattes.cnpq.br/4576483799093464 | |
2 | DESIREE SOUZA GONCALVES | Master | http://lattes.cnpq.br/3957328524360494 |
3 | FLAVIO AUGUSTO FERREIRA MARTINS BEZERRA | Master | http://lattes.cnpq.br/1717066274329803 |
4 | GABRIEL FONSECA SARMANHO | Master | http://lattes.cnpq.br/6973225121960746 |
5 | LUIZ HENRIQUE DA CONCEICAO LEAL | Master | http://lattes.cnpq.br/8849370590932263 |
6 | MARCIO VIEIRA MACHADO FERNANDES | Master | http://lattes.cnpq.br/4659829389307887 |
7 | MARCOS ANTONIO HERMOSA BAEZ | Master | http://lattes.cnpq.br/2217680032573189 |
8 | MARCUS VINICIUS VIEGAS PINTO | Master | http://lattes.cnpq.br/7633804549211481 |
9 | NATALIA GONCALVES RAMOS | Master | http://lattes.cnpq.br/3164537203461348 |
10 | RUAN CARVALHO MAYWORM | Doctorate | http://lattes.cnpq.br/5951712664292058 |
11 | VANESSA KAPPS | Doctorate | http://lattes.cnpq.br/2882093653568690 |
Contact us
+ 55 (21) 2145-3121 | ppgmetrologia@inmetro.gov.br